Capabilities and Attributes
Featured below is a simple diffraction slide under 400x magnification in order to demonstrate specific capabilities of the instrument. Components of microscopy in regards to this instrument include: brightfield, darkfield, phase-contrast and incident-light fluorescence. Of particular interest are measurements that can be inserted into the shot.
Fig. 1. Useful measurements, indicated by the picture, can be incorporated into the specimen shot (Brightfield microscopy visible through video documentation compliance).
Table 1: Annotations and Measurement
(1) | Straight line length |
(2) | Region area |
(3) | Angle |
(4) | Rectangle perimeter |
(5) | Calibration mark |
Other attributes available to the user, but not exhibited in the figure include: curve length, ellipse perimeter, rectangle area and ellipse area.